3 units
- VLSI Systems
- The Remaining Units
- The Remaining 21 Units
Offered: Summer 2027 (not offered), Spring 2027 (unknown), Fall 2026 (offered)
Counts toward
- Computer Engineering, M.S. (2026-27) - VLSI Systems, The Remaining Units
- Computer Engineering, M.S. (2025-26) - VLSI Systems, The Remaining Units
- Electrical Engineering, M.S. (2026-27) - The Remaining 21 Units
Theory and techniques for testing VLSI circuits and systems. Analog/mixed-signal testing, Automatic Test Pattern Generation (ATPG), boundary scan and core-based testing, Built-in Self-Test (BIST), defect and fault diagnosis, Design For Testability (DFT), logic/fault simulation, memory test, machine learning applications in VLSI testing, scan design/architecture.
From the catalog
- Who can take it
- COMPE 470 or Graduate Standing
- Grading
- LTR: Letter Graded. The class will be offered for letter grade with no option to take it for Cr/NC
- Formerly numbered
- E E 671
0 sections in Spring 2027
COMPE 671 is not offered in Spring 2027. Check all COMPE classes for other terms.